Chip on Submount/CoS Test Bench

Task

Duplication and basic modernization of an already existing CoS test bench. Design and new development of the control software. Implementation of new flexible mechanisms for test run creation.

Requirements

  • User access control (user name / password)
  • Two user levels (Administrator, Operator)
  • Duplicated measurement hardware to survey two laser diodes at the same time
  • Access to customer's database
  • Free configuration of test runs using recipes (bundling complex test steps into one structure)
  • Optimized parallel control of duplicated measurement hardware
  • Graphical visualization of measurement data, calculation and display of additional key data
  • Defective laser diodes are not surveyed any more to save time
  • Measurement data and calculated key data are saved to database; these values accompany each individual laser diode during the further production process
LabVIEW Application

Solution

Software development and programming in LabVIEW (National Instruments). Data acquisition using two 3706 Switch Systems (Keithley Instruments), two integrating spheres with Optical Switch EOL 1x2 (IOTech) and Optical Spectrum Analyzer/OSA AQ6370 (Yokogawa) downstream; test bench control by two linear axes XPS (Newport), Temperature Controller 2510AT and two Source Meters 2602A (each Keithley Instruments).