Designing of an application for a semiautomatic
test station within the phase of the final control of equipped
printed circuit boards. Automatic test of function clusters. Manual control mechanisms
available for debugging.
Requirements
Most simple and clear operation
Integration of situation dependent user requests (adaption, manual execution of test sequences a.s.o.)
Visual support by gated pictures and drafts
Visualization of the results from each single test
Debug capability of semiautomatic test courses
Control of a multi I/O PC card as both a stimulant and a measurement device
Solution
Realizing the application with Lab Windows/CVI (National Instruments).
Grouping of the single tests on separate register cards.
Standardized panel appearance; no re-learning necessary if the DUT type is changed.
Displaying of the entire status.
